Modern semiconductor fabs generate vast amounts of data from equipment, processes, sensors, metrology tools, and factory automation systems. The real challenge is transforming this data into actionable insights that improve yield, quality, productivity, and operational efficiency.
Join the IEEE Oregon Section Joint EDS & MTT-S Chapter for the webinar, "From Data to Decisions: Smart Manufacturing Analytics in Semiconductor Production."
This session will explore how advanced analytics, AI/ML, predictive maintenance, digital twins, and smart manufacturing technologies are enabling data-driven decision-making in semiconductor factories. Attendees will gain insights into how leading fabs use real-time data to optimize performance, enhance equipment utilization, and drive operational excellence.
Ideal for students, researchers, engineers, and industry professionals interested in the future of smart semiconductor manufacturing.
Speaker(s): , Dr. Naznin Akter
Virtual: https://events.vtools.ieee.org/m/564955
