Many biomedical and medical-device systems, especially implantable electronics, require mission-critical reliability to support patient safety, therapy delivery, and measurement accuracy. These systems rely heavily on mixed-signal circuits such as sensor front ends, amplifiers, data converters, stimulators, references, clocks, and power-management blocks.
While these circuits are rigorously verified during production test, burn-in, and characterization, long-term reliability challenges can persist after manufacturing. Over a device’s lifetime, circuit behavior can drift due to aging, leakage, environmental stress, packaging effects, and varying operating conditions.
This webinar explores how embedded mixed-signal test and self-monitoring techniques can support the lifetime reliability of biomedical electronics. The discussion will connect traditional production-test concepts with periodic or in-field health monitoring and safe diagnostics. Topics will include analog and mixed-signal built-in self-test (BIST) architectures, embedded current and leakage monitoring, IDDQ-style measurements, burn-in support, self-calibration, and compact diagnostic signatures.
The talk will also highlight how limited external access can be complemented by on-chip diagnostic resources and firmware-coordinated test flows. Ultimately, the session will show how reusing embedded resources can reduce dependence on external test access, improve observability, and support data-driven decisions about device performance and reliability over time.
Speaker(s): Krishna Madabhushi
Virtual: https://events.vtools.ieee.org/m/564141
