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DTSTART;TZID=America/Phoenix:20260702T110000
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SUMMARY:Embedded Mixed-Signal Test & Reliability Monitoring in Biomedical Electronics
DESCRIPTION:Many biomedical and medical-device systems\, especially implantable electronics\, require mission-critical reliability to support patient safety\, therapy delivery\, and measurement accuracy. These systems rely heavily on mixed-signal circuits such as sensor front ends\, amplifiers\, data converters\, stimulators\, references\, clocks\, and power-management blocks.\nWhile these circuits are rigorously verified during production test\, burn-in\, and characterization\, long-term reliability challenges can persist after manufacturing. Over a device’s lifetime\, circuit behavior can drift due to aging\, leakage\, environmental stress\, packaging effects\, and varying operating conditions.\nThis webinar explores how embedded mixed-signal test and self-monitoring techniques can support the lifetime reliability of biomedical electronics. The discussion will connect traditional production-test concepts with periodic or in-field health monitoring and safe diagnostics. Topics will include analog and mixed-signal built-in self-test (BIST) architectures\, embedded current and leakage monitoring\, IDDQ-style measurements\, burn-in support\, self-calibration\, and compact diagnostic signatures.\nThe talk will also highlight how limited external access can be complemented by on-chip diagnostic resources and firmware-coordinated test flows. Ultimately\, the session will show how reusing embedded resources can reduce dependence on external test access\, improve observability\, and support data-driven decisions about device performance and reliability over time.\nSpeaker(s): Krishna  Pramod Madabhushi\nVirtual: https://events.vtools.ieee.org/m/564141
URL:https://www.ieeer6.org/event/embedded-mixed-signal-test-reliability-monitoring-in-biomedical-electronics/
LOCATION:Virtual: https://events.vtools.ieee.org/m/564141
CATEGORIES:Local Events
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