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DTSTART;TZID=America/Los_Angeles:20260624T080000
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DTSTAMP:20260608T060752
CREATED:20260318T191220Z
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UID:10000326-1782288000-1782406800@www.ieeer6.org
SUMMARY:Center for Advanced Signal and Image Sciences (CASIS) 30th Annual Workshop
DESCRIPTION:We are thrilled to host LLNL’s 30th Center for Advanced Signal and Image Sciences (CASIS) workshop. The workshop returns with a full 2-day in-person schedule on Wednesday and Thursday\, June 24-25\, 2026.\nWe encourage a broad range of technical topics at the workshop and being non-archival apart from original work\, we are also considering intermediate results from ongoing efforts as well as recently published publications for presentation as a talk and/or a poster. The goal of the workshop is to provide a platform for the exchange of ideas and network with peers across disciplines to foster collaboration and build community. Please submit your abstract by Friday\, May 15\, 2026. Authors will be notified of the review decisions one week later on May 22\, 2026.\nApart from the regular presentation track we will feature parallel tutorials\, hands-on mini workshops and a dedicated student track to introduce career opportunities at LLNL.\nThe workshop will be held in-person at the (https://uclcc.org/) and requires pre-registration until June 18\, 2026. As this is a 2-day whole-day workshop\, we will provide coffee and snacks in morning and afternoon breaks as well as a lunch on both days. As this is our 30th anniversary\, we will also host a Happy Hour following the regular program on Wednesday\, June 24\, 2026.\n(https://engineering.llnl.gov/centers/casis/workshops)\nThis year’s workshop features presentations in the following tracks\, moderated by the Program Chairs:\n– AI/Machine Learning (PhanNguyen\, Kowshik Thopalli)\n– National Ignition Facility (Eugene Kur\, Christopher Miller)\n– Non-Destructive Evaluation (Seemeen Karimi\, Harry Martz)\n– Quantum Sensing & Quantum Computing (Kristi Beck)\n– Remote Sensing\, Non-Invasive Imaging & Inverse Problems (Sean Lehman\, Viacheslav Li)\n– Robotics & Automation (Aldair Gongora\, Abhik Sarkar)\n– Student Track: All topics (Poster only) (Ted Bauman\, Min Priest)\nBecome part of this great experience and submit your talk proposal at https://engineering.llnl.gov/centers/casis/workshops before May 15\, 2025!\nCheck out (https://www.llnl.gov/article/53041/annual-workshop-brings-together-signal-image-science-community) for last year’s amazing event to see what to expect!\nThe no-fee CASIS Workshop is sponsored by the (https://engineering.llnl.gov/) and held at the (https://uclcc.org/). It is organized by the (https://engineering.llnl.gov/centers/casis)\, and is a joint meeting with the local chapters of the (https://www.ewh.ieee.org/r6/oeb/SigProc/sigproc.html) and (https://r6.ieee.org/sfoeb-cs/). supported by the (https://r6.ieee.org/oeb/).\nCo-sponsored by: Lawrence Livermore National Laboratory – Center for Advanced Signal and Image Sciences\nBldg: Building 661 L-794\, University of California Livermore Collaboration Center\, 7000 East Ave\, Livermore\, California\, United States\, 94550
URL:https://www.ieeer6.org/event/center-for-advanced-signal-and-image-sciences-casis-29th-annual-workshop/
LOCATION:Bldg: Building 661 L-794\, University of California Livermore Collaboration Center\, 7000 East Ave\, Livermore\, California\, United States\, 94550
CATEGORIES:Local Events
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260625T170000
DTEND;TZID=America/Los_Angeles:20260625T181500
DTSTAMP:20260608T060752
CREATED:20260604T144228Z
LAST-MODIFIED:20260607T145717Z
UID:10000578-1782406800-1782411300@www.ieeer6.org
SUMMARY:IEEE PES Lecture: Cable Ampacity and Sizing Calculations
DESCRIPTION:[]\nCable Ampacity and Sizing calculations will be covered in the presentation.\nCable Ampacity calculation is the consideration of Cable’s Thermal limits. The analysis helps determine the maximum current a conductor can carry under certain operating conditions without exceeding its temperature rating. Verifying that the conductor does not exceed the thermal rating is important as it ensures normal and proper operation within the Power System. In this presentation the common concepts\, calculation methods\, standards\, and procedure for performing cable ampacity calculations will be discussed.\nCable Sizing calculation is essential in power systems analysis. With a proper selected cable size\, it ensures safe\, efficient\, and reliable operation of the entire electrical system. The analysis ensures that the system operates correctly under normal and fault conditions. This presentation will examine the key constraints that influence the selection of the appropriate cable size.\nAbout the Speaker:\nAvelardo Morales\, Department Manager\, Cable and Low Voltage Systems\nAvelardo Morales has 20 years of experience as a Power Engineer at the same leading company\, where he began his career shortly after obtaining his degree in electrical engineering from California\, State University Los Angeles. At ETAP\, Avelardo is now a Senior Power Engineer and Department Manager for Cable and Low Voltage Systems. He specializes in Cable\, Low Voltage and Panel Systems\, Underground Raceway Systems\, and Load Flow Analysis. Avelardo plays a critical role in bridging software development with practical engineering applications\, ensuring that the software functions to meet industry standards and user needs. He is an IEEE member.\nVirtual: https://events.vtools.ieee.org/m/562345
URL:https://www.ieeer6.org/event/ieee-pes-lecture-cable-ampacity-and-sizing-calculations/
LOCATION:Virtual: https://events.vtools.ieee.org/m/562345
CATEGORIES:Local Events
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DTSTART;TZID=America/Los_Angeles:20260625T170000
DTEND;TZID=America/Los_Angeles:20260625T190000
DTSTAMP:20260608T060752
CREATED:20260511T031231Z
LAST-MODIFIED:20260607T145717Z
UID:10000516-1782406800-1782414000@www.ieeer6.org
SUMMARY:Innovation in Action: WIE Case Challenge
DESCRIPTION:The Innovation in Action: WIE Case Challenge is designed to strengthen the connection between academia\, technology\, and industry by bringing students and professionals together in a collaborative and engaging environment. During the event\, students will be grouped with industry professionals and mentors to work as teams on a real-world engineering or technology-related challenge. Participants will have the opportunity to exchange ideas\, develop innovative solutions\, strengthen leadership and teamwork skills\, and build meaningful professional connections while learning from one another’s experiences and perspectives.\nCo-sponsored by: CSUN IEEE\n 18111 Nordhoff St\, Northridge\, California\, United States\, 91330
URL:https://www.ieeer6.org/event/innovation-in-action-wie-case-challenge/
LOCATION:18111 Nordhoff St\, Northridge\, California\, United States\, 91330
CATEGORIES:Local Events
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260625T180000
DTEND;TZID=America/Los_Angeles:20260625T190000
DTSTAMP:20260608T060752
CREATED:20260607T145717Z
LAST-MODIFIED:20260607T145717Z
UID:10000585-1782410400-1782414000@www.ieeer6.org
SUMMARY:Systematically Managing Complexity in Power Electronics Modeling and Design
DESCRIPTION:Power electronics is a foundational technology that drives a wide range of important and emerging applications including cloud computing\, wireless communications\, robotics\, and smart energy systems. By systematically managing the increased complexity in materials\, circuits\, and systems\, new opportunities are created to greatly advance the functionality and performance of power electronics systems.\nThis speech provides a few examples to illustrate the potential of managed complexity in power electronics design. These include: 1) modular and scalable architecture for systematically managed complexity in high performance circuits; 2) artificial intelligence and machine learning for systematically managed complexity in passive component modeling. This managed complexity approach addresses key challenges in emerging applications by overcoming traditional design barriers from new angles and redefining how power electronics are conceived and implemented in complex systems.\nSpeaker(s): Minjie Chen\nMurata Electronics North America\, Inc.\, 1732 North First Street #500\, San Jose\, California\, United States\, 95112
URL:https://www.ieeer6.org/event/systematically-managing-complexity-in-power-electronics-modeling-and-design/
LOCATION:Murata Electronics North America\, Inc.\, 1732 North First Street #500\, San Jose\, California\, United States\, 95112
CATEGORIES:Local Events
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DTSTART;TZID=America/Los_Angeles:20260625T180000
DTEND;TZID=America/Los_Angeles:20260625T193000
DTSTAMP:20260608T060752
CREATED:20260525T202818Z
LAST-MODIFIED:20260607T145716Z
UID:10000553-1782410400-1782415800@www.ieeer6.org
SUMMARY:Brewing Confidence Together: Leadership Stories & Coffee Chats
DESCRIPTION:IEEE Oregon Section Women in Engineering AG and the joint Oregon Section chapter of Electron Devices Society (ED) and IEEE Microwave Theory and Techniques (MTT) are going to celebrate the "WIE Day 2026" by bringing together STEM professionals in a relaxed coffeehouse atmosphere to share authentic leadership journeys\, career lessons\, challenges\, and empowerment stories while enjoying coffee\, snacks\, and meaningful networking conversations.\nThe event is designed to foster:\n– Leadership inspiration\n– Career empowerment\n– Intergenerational mentorship\n– Professional networking\n– Inclusive STEM community building\n[]\nAva Roasteria – Orenco\, 936 NE Orenco Station Loop\,  Hillsboro\, Oregon\, United States\, 97124
URL:https://www.ieeer6.org/event/brewing-confidence-together-leadership-stories-coffee-chats/
LOCATION:Ava Roasteria – Orenco\, 936 NE Orenco Station Loop\,  Hillsboro\, Oregon\, United States\, 97124
CATEGORIES:Local Events
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260625T180000
DTEND;TZID=America/Los_Angeles:20260625T200000
DTSTAMP:20260608T060752
CREATED:20260430T212713Z
LAST-MODIFIED:20260607T145716Z
UID:10000491-1782410400-1782417600@www.ieeer6.org
SUMMARY:EMC Scan Technologies
DESCRIPTION:EMC Scan Technologies"\nNear field scanning is a widely known and well received method for component\, module and system EMC characterization. One specific emission scan technology\, called the NF EMI scan\, is the most common scan technology\, but the immunity scan is relatively less known and less widely used. Three immunity and two emission scan technologies will be presented: ESD Scan\, RF Immunity Scan\, Current Spreading (CSP) and Phase Measurement Scan.\nESD scan is a very effective scan technique to debug or pre-screen components or modules that are more likely to cause problems (specially soft failures) before they are integrated to a system. Its main goal is localizing weak spots or traces causing ESD gun test failures with a well-controlled disturbance source.\nRF Immunity Scan is very similar to ESD scan in concept\, but it is a narrow-band scan while the ESD scan is a wide-band.\nMost currents injected by an ESD gun follow the intended path by design\, but a small amount causing system upset can flow through an unexpected route. CSP (Current Spreading) is a visualization technique for surface current flows\, which identifies unexpected current paths and can verify ESD protection design.\nPhase information helps improving accuracies of modeling of EUT's for simulation or can be directly used for specific applications. Specific application of the phase information will be introduced after brief review of simultaneous magnitude and phase measurement in time and frequency domain.\nSpeaker(s): Kyungjin "Jin" Min\nAgenda:\nAgenda:\n6PM – 6:45PM Dinner and Networking\n6:45PM – 8PM Talk and Questions\nThursday June 25\, 2026\nRoom: Building C training room\, Bldg: C\, 10401 roselle street\, ATEC\, San Diego\, California\, United States\, 92121
URL:https://www.ieeer6.org/event/emc-scan-technologies/
LOCATION:Room: Building C training room\, Bldg: C\, 10401 roselle street\, ATEC\, San Diego\, California\, United States\, 92121
CATEGORIES:Local Events
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